Texas Instruments SCANSTA111MT/NOPB, 7-Bit Addressable Scan Port, 3 → 3.6 V, 48-Pin TSSOP
技術文件
規格
Brand
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Mounting Type
Surface Mount
Package Type
TSSOP
Pin Count
48
Dimensions
12.6 x 6.2 x 1.05mm
Length
12.6mm
Width
6.2mm
Height
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+85 °C
Minimum Operating Supply Voltage
3 V
Minimum Operating Temperature
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Operating Temperature Range
-40 → +85 °C
產品詳情
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
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P.O.A.
Each (In a Tube of 38) (不含稅)
38
P.O.A.
Each (In a Tube of 38) (不含稅)
暫時無法取得庫存資訊。
38
暫時無法取得庫存資訊。
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技術文件
規格
Brand
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Mounting Type
Surface Mount
Package Type
TSSOP
Pin Count
48
Dimensions
12.6 x 6.2 x 1.05mm
Length
12.6mm
Width
6.2mm
Height
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+85 °C
Minimum Operating Supply Voltage
3 V
Minimum Operating Temperature
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Operating Temperature Range
-40 → +85 °C
產品詳情
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
醞釀。 創造。 合作
免費加入
無隱藏費用！
- 下載並使用我們的 DesignSpark 軟體進行 PCB 和 3D 機械設計
- 查看網站內容和論壇
- 下載超過一百萬種產品的 3D 模型、原理圖和封裝