Technical Documents
Specifications
Brand
NexperiaDiode Configuration
Complex Array
Product Type
TVS Diode Array
Direction Type
Bi-Directional
Minimum Breakdown Voltage Vbr
6V
Mount Type
Surface
Package Type
SOT-457 (SC-74)
Pin Count
6
Minimum Operating Temperature
-55°C
Test Current It
1mA
ESD Protection
Yes
Number of Elements per Chip
4
Maximum Operating Temperature
150°C
Height
1.1mm
Length
3.1mm
Standards/Approvals
No
Width
1.7mm
Series
PRTR
Maximum Reverse Leakage Current
100nA
Automotive Standard
AEC-Q101
Product Details
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.
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Stock information temporarily unavailable.
90.00 MOP
3.599 MOP Each (Supplied on a Reel) (ex VAT)
Production pack (Reel)
25
90.00 MOP
3.599 MOP Each (Supplied on a Reel) (ex VAT)
Stock information temporarily unavailable.
Production pack (Reel)
25
| quantity | Unit price | Per Reel |
|---|---|---|
| 25 - 725 | 3.599 MOP | 89.96 MOP |
| 750 - 1475 | 3.504 MOP | 87.59 MOP |
| 1500+ | 3.45 MOP | 86.25 MOP |
Ideate. Create. Collaborate
JOIN FOR FREE
No hidden fees!
Technical Documents
Specifications
Brand
NexperiaDiode Configuration
Complex Array
Product Type
TVS Diode Array
Direction Type
Bi-Directional
Minimum Breakdown Voltage Vbr
6V
Mount Type
Surface
Package Type
SOT-457 (SC-74)
Pin Count
6
Minimum Operating Temperature
-55°C
Test Current It
1mA
ESD Protection
Yes
Number of Elements per Chip
4
Maximum Operating Temperature
150°C
Height
1.1mm
Length
3.1mm
Standards/Approvals
No
Width
1.7mm
Series
PRTR
Maximum Reverse Leakage Current
100nA
Automotive Standard
AEC-Q101
Product Details
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.
Ideate. Create. Collaborate
JOIN FOR FREE
No hidden fees!
